Microchip DOC200103 handleiding
Handleiding
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Hi-Rel Standard
Ordering Informaon
Product Specication
© 2025 Microchip Technology Inc. and its subsidiaries
DS00005937A - 17
Table 6-8. Screening and Test Matrix
OPN.
NO.
Operation
Listing
Requirements and Conditions Option
K
Option
F
Option
S
Option
C
Option
B
Option
X
SCREENING MIL Class Similarity
(MIL-PRF-55310, Class S/B or
MIL-PRF-38534, Class K)
M38534K
K
M55310F
S
M55310E
S
M55310F
B+
M55310F
B
EM
1 Non-Destruct Bond Pull MIL-STD-883, Method 2023 X X X NR NR NR
2 Internal Visual MIL-STD-883, Method 2017 Class K or H,
Method 2032 Class K or H
X
K
X
K
X
K
X
H
X
H
X
H
3 Stabilization (Vacuum)
Bake
MIL-STD-883, Method 1008,
Cond. C, 150 °C
X
48 hrs.
X
48 hrs.
X
48 hrs.
X
48 hrs.
X
48 hrs.
X
24 hrs.
4 Random Vibration MIL-STD-883, Method 2026, Cond. I-B,
15 mins in each axis
NR X NR NR NR NR
5 Thermal Shock MIL-STD-883, Method 1011, Cond. A X X X NR NR NR
6 Temperature Cycle MIL-STD-883, Method 1010, Cond. B
10 cycles min.
MIL-STD-883, Method 1010, Cond. C
10 cycles min.
X
NR
NR
X
X
NR
X
NR
X
NR
NR
NR
7 Constant Acceleration MIL-STD-883, Method 2001,
Cond. A,Y1 plane only, 5000g
X X X X X NR
8 Particle Impact Noise
Detection
MIL-STD-883, Method 2020, Cond. B
MIL-STD-883, Method 2020, Cond. A
X
NR
NR
X
X
NR
X
NR
NR
NR
NR
NR
9 Electrical Testing,
Pre Burn-In
Nominal Vcc, +25 °C X X X X X X
10 1
st
Burn-In MIL-STD-883, Method 1015, Cond. B X
160 hrs.
X
240 hrs.
X
240 hrs.
X
160 hrs.
X
160 hrs.
NR
11 Electrical Testing,
Intermediate
Nominal Vcc, +25°C and Op Temp Extremes X NR NR NR NR NR
12 2
nd
Burn-In MIL-STD-883, Method 1015, Cond. B X
160 hrs.
NR NR NR NR NR
13 Electrical Testing,
Post Burn-In
Nominal Vcc and extremes, nominal
temperature and extremes
X X X X X NR
14 Seal: Fine Leak MIL-STD-202, Method 112, Cond. C
(5 x 10
-8
atm cc/sec max)
MIL-STD-883, Method 1014, TC
A2 or B1
X
NR
NR
X
X
NR
X
NR
X
NR
X
NR
15 Seal: Gross Leak MIL-STD-202, Method 112, Cond. D
MIL-STD-883, Method 1014, TC B2 or B3
X
NR
NR
X
X
NR
X
NR
X
NR
X
NR
16 Radiographic Inspection MIL-STD-883, Method 2012 X X X X NR NR
17 Solderability MIL-STD-883, Method 2003
1 1 1 1 1 1
18 External Visual MIL-STD-883, Method 2009 X X X X X NR
19 Group A Electrical Test
3
MIL-PRF-55310 X X X Sample Sample NR
20 Aging, 30 Day
2
(M55310 Group B)
MIL-PRF-55310, para. 4.8.35.1 X X X Sample Sample NR
21 Group C Inspection
(optional)
See 4.2. Optional Design, Test, and
Data Parameters for details of supplier
recommended Group C Inspection options
4.2(g) 4.2(f) 4.2(e) 4.2(e) 4.2(e) NR
LEGEND: X = Required, NR = Not Required
Notes:
1. Performed at package LAT. Include LAT data sheet.
2. See 3.3.5.1. Frequency Aging Duration Option.
3. See 4.4. Delta Limit Exception.
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Productinformatie
| Merk | Microchip |
| Model | DOC200103 |
| Categorie | Niet gecategoriseerd |
| Taal | Nederlands |
| Grootte | 4591 MB |
