Microchip DOC200103 handleiding
Handleiding
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Hi-Rel Standard
Detail Requirements
Product Specication
© 2025 Microchip Technology Inc. and its subsidiaries
DS00005937A - 7
3.1.4. Semiconductors (Transistors, Diodes, etc.)
3.1.4.1. Design Pedigree E
For Design Pedigree E, the semiconductors shall be from homogeneous wafer lots that meet
the Enhanced Element Evaluation requirements in DOC208191 and meet the requirements of MIL-
PRF-38534 Revision L for Class K.
3.1.4.2. Design Pedigree R
For Design Pedigree R, semiconductors shall be from homogeneous wafer lots that have
successfully completed the MIL-PRF-38534, Revision K Lot Acceptance Tests for Class K devices as a
minimum.
3.1.4.3. Design Pedigrees B and C
For Design Pedigree B and C, semiconductors are procured from wafer lots that have successfully
completed the MIL-PRF-55310 Lot Acceptance Tests for Class B devices as a minimum.
3.1.4.4. Design Pedigree D
For Design Pedigree D, semiconductors can be COTS level or higher.
3.1.5. Radiaon
Microcircuits and semiconductors for Design Pedigrees E and R are from wafer lots that are
certied to 100 krad (Si) total dose minimum. Sinewave devices are assembled with all bipolar
semiconductors and bipolar constructed microcircuits. ACMOS devices are assembled with all
bipolar semiconductors and bipolar constructed microcircuits, except for the ACMOS chip used to
provide the CMOS output. In addition, the bipolar transistors are considered insensitive to Single
Event Eects. The ACMOS die is from a certied wafer lot that is radiation tested to a minimum of
100 krad. NSC, the 54ACT designer, has characterized the SET LET up to 40 MeV and SEL LET up to
120 MeV for the FACT
™
family (AN-932). Microchip conducted additional SEE testing in 2008 to verify
this performance since our lot wafer testing does not include these parameters and determinations.
3.1.6. Packages
Packages are procured that meet the construction, lead materials and nishes as specied in
MIL-PRF-55310. All leads are Kovar with gold plating over a nickel underplate. Package lots are
evaluated in accordance with the requirements of MIL-PRF-38534. Microchip will not perform Salt
Spray testing as part of MIL-PRF-55310 Group C/Qualication. In accordance with MIL-PRF-55310,
package evaluation results for salt atmosphere will be substituted for Salt Spray testing during
MIL-PRF-55310 Group C/Qualication.
3.1.6.1. Traceability and Homogeneity
All design pedigrees except option D have active device lots that are homogeneous and traceable
to the manufacturer’s individual wafer. Swept Quartz crystals are traceable to the quartz bar and
the processing details of the autoclave lot; however, multiple lots of un-plated crystals, bases, and
covers may be combined into a single sealed crystal manufacturing lot. For design pedigrees E
and R only, passive elements, crystals, and materials are traceable to their manufacturing lots.
Manufacturing lot and date code information shall be recorded, by TCXO serial number, of every
component and all materials used in the manufacture of those TCXOs. A production lot, as dened
by Microchip, is all oscillators that have been kitted and built as a single group. The maximum
deliverable quantity with a single lot date code is 100 units. Order quantities that exceed 100 units
will be delivered in multiple lot date codes with deliveries separated by 4 weeks. If applicable, each
production lot will be kitted with homogeneous material which is then allocated across multiple lot
date code builds to satisfy the deliverable order quantity. When ordered, Group C Inspection, lot
qualications, and/or DPA will be performed on the rst build lot within the production lot unless
otherwise stated on the purchase order.
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Productinformatie
| Merk | Microchip |
| Model | DOC200103 |
| Categorie | Niet gecategoriseerd |
| Taal | Nederlands |
| Grootte | 4591 MB |
