Microchip DOC200103 handleiding
Handleiding
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Hi-Rel Standard
Quality Assurance Provisions and Vericaon
Product Specication
© 2025 Microchip Technology Inc. and its subsidiaries
DS00005937A - 11
j. Worst Case Circuit Analysis (unless otherwise specied, MIL-HDBK-1547)
k. Derating and Thermal Analysis (unless otherwise specied, MIL-HDBK-1547 with T
j
Max = +105 °C;
Case Temperature = +85 °C)
l. Process Identication Documentation (PID)
m. Customer Source Inspection (pre-cap/nal) [Note: Model numbers 2105, 2205, 2115 and 2215
require two pre-cap inspections.]
n. Destruct Physical Analysis (DPA): MIL-STD-1580 with exceptions as specied in Microchip
DOC203982.
o. Qualication: In accordance with MIL-PRF-55310, Rev F, Table IV (requires 16 destruct specimens).
Includes Group III, SG1 through SG6 only. ESD (SG7) not performed.
p. Qualication: In accordance with EEE-INST-002, Section C4, Table 3, Level 1 or 2 (requires 11
destruct specimens)
q. High Resolution Digital Pre-Cap Photographs (20 Megapixels minimum)
r. Hot solder dip of leads with Sn63/Pb37 solder prior to shipping.
s. As Designed Parts, Materials and Processes List
4.2.1. NASA EEE-INST-002
A combination of Design Pedigree R, Option F Screening, and Qualication per EEE-INST-002, Section
C4, Table 3 meet the requirements of Level 1 and Level 2 device reliability.
4.3. Test Condions
Unless otherwise stated herein, inspections are performed in accordance with those specied in
MIL-PRF-55310. Process travelers identify the applicable methods, conditions and procedures to be
used. Examples of electrical test procedures that correspond to MIL-PRF-55310 requirements are
shown in Table 6-7.
4.4. Delta Limit Excepon
When MIL-PRF-55310, Revision F was being reviewed for release by manufacturers and users,
Microchip and other organizations recommended that burn-in delta limits not be applied to logic
level measurements due to the inconsistency in attempting to measure small changes in logic levels
which inherently have ringing in the signal. This is especially true in higher frequency oscillators
measured in automated test systems that are aected by cable length that is not representative
of the user’s application and contact resistance in test xtures that do not provide a consistent
Vcc or Ground connection. The exact test setup conditions may vary slightly from pre-burn-in to
post-burn-in and cause small articial deltas in logic level measurements that are not indicative of
an issue. Any signicant changes in logic levels will be reected in supply current deltas and/or logic
levels that exceed the min/max limits. As a result, we take exception to MIL-PRF-55310, Revision F,
Para. 4.4.5 and the delta limit for Output Low Level as specied in 4.4.5(c) shall not be applied to
Burn-in PDA.
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Productinformatie
| Merk | Microchip |
| Model | DOC200103 |
| Categorie | Niet gecategoriseerd |
| Taal | Nederlands |
| Grootte | 4591 MB |
