Microchip DOC206379 handleiding
Handleiding
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Hi-Rel Standard
Detail Requirements
Product Specication
© 2025 Microchip Technology Inc. and its subsidiaries
DS00005882A - 6
3. Detail Requirements
3.1 Components
3.1.1 Crystals
Cultured quartz crystal resonators are used to provide the selected frequency for the devices. The
optional use of Premium Q swept quartz can, because of its processing to remove impurities, be
specied to minimize frequency drift when operating in radiation environments. In accordance with
MIL-PRF-55310, the manufacturer has a documented crystal element evaluation program.
3.1.2 Passive Components
3.1.2.1 Design Pedigree E
For Design Pedigree E, where available, resistors shall be Established Reliability, Failure Rate R (as a
minimum) and capacitors shall be Failure Rate S.
Where resistors and capacitors are not available as ER parts, and for all other passive components,
the parts shall be from homogeneous manufacturing lots that have successfully completed the
Enhanced Element Evaluation of DOC208191 which meets the requirements of MIL-PRF-38534
Revision L for Class K.
3.1.2.2 Design Pedigree F and V
For Design Pedigree F and V, where available, resistors shall be Established Reliability, Failure
Rate R (as a minimum) and capacitors shall be Failure Rate S. Where resistors and capacitors
are not available as ER parts, and for all other passive components, the parts shall be from
homogeneous manufacturing lots that have successfully completed the Class K Element Evaluation
of MIL-PRF-38534 Revision K for Class K.
3.1.2.3 Design Pedigree D
For Design Pedigree D, the passive elements will be COTS level or higher.
3.1.2.4 Inductors
When used, inductors will be open construction and may use up to 47-gauge wire.
3.1.3 Microcircuits
The ACMOS microcircuit die is sourced in accordance with Standard Microcircuit Drawing
5962F8760901V9A, 5962F1820201V9A, and/or 5962F8974902V9A, Class V (MIL-PRF-38535) qualied
device, except for Design Pedigree D, which will use COTS level or higher.
3.1.4 Semiconductors
3.1.4.1 Design Pedigree E
For Design Pedigree E, the semiconductors shall be from homogeneous wafer lots that meet the
Enhanced Element Evaluation requirements in DOC208191.
3.1.4.2 Design Pedigree F and V
For Design Pedigree F and V, semiconductors shall be from homogeneous wafer lots that have
successfully completed the MIL-PRF-38534, Revision K Lot Acceptance Tests for Class K devices as a
minimum.
3.1.4.3 Design Pedigree D
For Design Pedigree D, semiconductors can be COTS level or higher.
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Productinformatie
| Merk | Microchip |
| Model | DOC206379 |
| Categorie | Niet gecategoriseerd |
| Taal | Nederlands |
| Grootte | 3204 MB |
