Microchip DOC206379 handleiding

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Hi-Rel Standard
General Requirements
Product Specication
© 2025 Microchip Technology Inc. and its subsidiaries
DS00005882A - 4
2. General Requirements
2.1 Classicaon
All devices delivered to this specication are of hybrid technology conforming to Type 1, Class 2
of MIL-PRF-55310. Primarily developed as a Class S equivalent specication, options are imbedded
within it to also produce Class B, Engineering Model and Ruggedized COTS devices. Devices carry a
Class 2 ESDS classication per MIL-PRF-38534.
2.2 Item Idencaon
Unique model number series are utilized to identify device package congurations as listed in Table
6-1.
2.3 Absolute Maximum Rangs
Table 2-1. Absolute Maximum Rangs
Parameter Value
Supply Voltage Range (V
CC
= 3.3V or 5V)
Supply Voltage Range (V
CC
=
1.8V or 2.5V)
–0.5 Vdc to +7.0 Vdc
–0.3 Vdc to +4.8 Vdc
Storage Temperature Range (T
STG
) –65 °C to +125 °C
Junction Temperature (T
J
) [V
CC
= 3.3V or 5V]
Junction Temperature (T
J
) [V
CC
=
1.8V or 2.5V]
+175 °C
+150 °C
Lead Temperature (Soldering, 10 Seconds) +300 °C
Output Source/Sink Current ±50 mA
2.4 Design, Parts, Materials and Processes, Assembly, Inspecon and Test
2.4.1 Design
The ruggedized designs implemented for these devices are proven in military and space applications
under extreme environments. Designs utilize 4-point crystal mounting in compliment with
Established Reliability (MIL-ER) componentry. When specied, radiation lot acceptance testing up
to 300 krad(Si) (RHA level F) can be included without altering the device’s internal topography.
2.4.1.1 Design and Conguraon Stability
Barring changes to improve performance by reselecting passive chip component values to oset
component tolerances, there will not be fundamental changes to the design or assembly or parts,
materials, and processes after rst product delivery of that item without notication.
2.4.1.2 Environmental Integrity
Designs have passed the environmental qualication levels of MIL-PRF-55310. These designs have
also passed extended dynamic levels of at least:
a. Sine Vibration: MIL-STD-202, Method 204, Condition G (30g pk.)
b. Random Vibration: MIL-STD-202, Method 214, Condition II-J (43.92g rms, three- minute duration in
each of three mutually perpendicular directions)
c. Mechanical Shock: MIL-STD-202, Method 213, Condition F (1500g, 0.5 ms)

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Productinformatie

MerkMicrochip
ModelDOC206379
CategorieNiet gecategoriseerd
TaalNederlands
Grootte3204 MB