Microchip 1520 handleiding

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Hi-Rel Standard
Detail Requirements
Product Specication
© 2025 Microchip Technology Inc. and its subsidiaries
DS00005882A - 7
3.1.5 Radiaon
Devices are assembled with bipolar semiconductors and an ACMOS chip used to provide the ACMOS
output. All active devices are acceptable for use in environments of up to 300 krad(Si) total dose
by Radiation Lot Acceptance Testing of the individual components. TID/ELDRS tolerance on the
bipolar transistors is veried by performing High Dose Rate (HDR) and/or Low Dose Rate (LDR)
Total Ionizing Dose to 300 krad(Si) at 42 mrad/s. The 5962F8760901V9A device is guaranteed
to have no SEL or SEU occurrences up to 93 MeV-cm
2
/mg. The 5962F1820201V9A device is SEL
immune up to 125 MeV-cm
2
/mg and SET immune up to 62.5 MeV-cm
2
/mg. The 5962F8974902V9A
device is SEL immune up to 93 MeV-cm
2
/mg. Prompt dose (dose rate) testing of devices that
use 5962F8760901V9A show that the part is immune to latch-up/burnout up to at least 1.32E10
rad(Si)/s and +125 °C. The parts exhibited no transients at a dose rate of 1E9 rad(Si)/s. At dose
rates up to 1.32E10, all parts recovered to pre-shot function and supply current within three to four
microseconds. Bipolar semiconductors are considered insensitive to Single Event Eects.
3.1.6 Packages
Packages are procured that meet the construction, lead materials and nishes as specied in
MIL-PRF-55310. All leads are Kovar with gold plating over a nickel underplate. Package lots are
evaluated in accordance with the requirements of MIL-PRF-38534. Microchip will not perform Salt
Spray testing as part of MIL-PRF-55310 Group C/Qualication. In accordance with MIL-PRF-55310,
package evaluation results for salt atmosphere will be substituted for Salt Spray testing during
MIL-PRF-55310 Group C/Qualication.
3.1.7 Traceability and Homogeneity
All design pedigrees except option D have active device lots that are homogenous and traceable
to the manufacturer’s individual wafer; all other elements and materials are traceable to their
manufacturer and incoming inspection lots. Design pedigrees E, F, and V have homogeneous
material. In addition, swept quartz crystals are traceable to the quartz bar and the processing
details of the autoclave lot. A production lot, as dened by Microchip, is all oscillators that have been
kitted and built as a single group. The maximum deliverable quantity with a single lot date code is
150 units. Order quantities that exceed 150 units will be delivered in multiple lot date codes with
deliveries separated by 3 weeks. If applicable, each production lot will be kitted with homogeneous
material which is then allocated across multiple lot date code builds to satisfy the deliverable order
quantity. When ordered, Group C Inspection, lot qualications, and/or DPA will be performed on the
rst build lot within the production lot unless otherwise stated on the purchase order.
3.2 Mechanical
3.2.1 Package Outline
Table 6-1 links each Hi-Rel Standard Model Number of this specication to a corresponding package
style. Mechanical Outline information of each package style is found in the referenced gure.
3.2.2 Thermal Characteriscs
The calculated thermal resistance and resulting junction temperature rise is found in Table 6-5.
3.2.3 Lead Forming
When the lead forming option is specied, the applicable leak test specied in screening will be
performed after forming.
3.3 Electrical
3.3.1 Input Power
Devices are available with an input voltage of either +5.0 Vdc (±10%), +3.3 Vdc (±10%), +2.5 Vdc
(±5%), or +1.8 Vdc (±5%). Current is measured, no load, at maximum rated operating voltage.

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Productinformatie

MerkMicrochip
Model1520
CategorieNiet gecategoriseerd
TaalNederlands
Grootte3204 MB