Microchip 1520 handleiding

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Handleiding

Hi-Rel Standard

Ordering Informaon

Product Specication

DS00005882A - 18

Table 6-7. Screening Test Matrix

OPN.

NO.

Operation

Listing

Requirements and Conditions Option

Option

SCREENING MIL Class Similarity

(MIL-PRF-55310, Class S/B or

MIL-PRF-38534, Class K)

100%

B-

100%

S-

100%

K+

100%

S (Rev E)

100%

—

100%

S (Rev F)

100%

1 Non-Destruct Bond Pull MIL-STD-883, Method 2023 X NR X X NR X NR X NR

2 Internal Visual MIL-STD-883, Method 2017 Class K,

Method 2032 Class K

X X X X X X X X X

3 Stabilization (Vacuum)

Bake

MIL-STD-883, Method 1008, Cond. C,

150°C

48 hrs.

24 hrs.

48 hrs.

24 hrs.

48 hrs.

24 hrs.

48 hrs.

24 hrs.

4 Random Vibration MIL-STD-883, Method 2026, Cond. I-B,

15 mins in each axis

NR NR NR NR NR NR NR X NR

5 Thermal Shock MIL-STD-883, Method 1011, Cond. A NR NR X NR NR X NR X NR

6 Temperature Cycle MIL-STD-883, Method 1010, Cond. B

(except Option S), 10 cycles min.

X X X X X X X X

Cond. C

7 Constant Acceleration MIL-STD-883, Method 2001,

Cond. A,Y1 plane only, 5000g

X X X X X X X X NR

8 Particle Impact Noise

Detection

MIL-STD-883, Method 2020, Cond. B

(except Option S)

X X X X X X NR X

Cond. A

9 Electrical Testing,

Pre Burn-In

Perform tests in Table 6-5. Nominal Vcc,

nominal temperature

X X X X X X X X X

10 1

Burn-In MIL-STD-883, Method 1015, Cond. B X

160 hrs.

240 hrs.

160 hrs.

240 hrs.

160 hrs.

240 hrs.

11 Electrical Testing,

Intermediate

Perform tests in Table 6-5. Nominal Vcc,

nominal temperature

X NR NR X NR NR NR NR NR

12 2

Burn-In MIL-STD-883, Method 1015, Cond. B X

160 hrs.

NR NR X

160 hrs.

NR NR NR NR NR

13 Electrical Testing,

Post Burn-In

(Group A)

Perform tests in Table 6-5. Nominal Vcc

and extremes, nominal temperature and

extremes

X X X X X X X

nom. Vcc

X NR

14 Seal: Fine Leak

Seal: Gross Leak

MIL-STD-202, Method 112, Cond. C

(5 x 10

-8

atm cc/sec max)

MIL-STD-202, Method 112, Cond. D

X X X X X X X NR X

15 Seal: Fine Leak

Seal: Gross Leak

MIL-STD-883, Method 1014,

Cond. A2 or B1

MIL-STD-883, Method 1014,

Cond. B2 or B3

NR NR NR NR NR NR NR X NR

16 Radiographic Inspection MIL-STD-883, Method 2012 X AR AR X AR X NR X NR

17 Solderability MIL-STD-883, Method 2003

1 1 1 1 1 1 1 1

18 External Visual

and Mechanical

MIL-STD-883, Method 2009 X

19 Aging, 30 Day

(M55310 Group B)

MIL-PRF-55310, para. 4.8.35.1 NR NR NR X 13 pcs. X NR X NR

20 Group C Inspection

(optional)

See 4.2. Optional Design, Test, and

Data Parameters for details of supplier

recommended Group C Inspection

options

4.2(g) 4.2(e) 4.2(e) 4.2(g) 4.2(e) 4.2(e) 4.2(e) 4.2(f) NR

Legend: X = Required, NR = Not Required, AR = As Required

Notes:

1. Performed at package LAT. Include LAT data sheet.

2. When specied, RGA samples will be removed from the lot after completion of this operation. Use of Screening failures require customer concurrence.

3. See 3.3.4.1. Frequency Aging Duration Option.

4. See 4.3.1. Delta Limit Exception.

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